Fri, May 29, 2020

Prof. Biplab Kumar Sikdar, Department of Computer Science and Technology

Tuesday, 21 June 2011 11:58
Biplab K. Sikdar
Biplab K. Sikdar Biplab K. Sikdar
Professor and Head,   Computer Science & Technology

  • PhD from Bengal Engineering and Science University, Shibpur, in 2003.
  • M. Tech in Computer Science & Engineering from Calcutta University, in 1990.
  • B. Tech in Computer Science & Engineering from Calcutta University, in 1988.
  • B. Sc(H) in Physics from Presidency College, Calcutta University, in 1985.

 

Contact Addresses
Residence
, West Bengal, India
Phone (office) +91 - 33 - 26684561/62/63 Ext.
Mobile +91 -
email

 

Research Areas

 

Recent Publications
  • Genetic algorithm based state assignment scheme for synthesis of testable FSMs targeting area and delay: S Roy, S Bandyopadhyay, U Maulik and Biplab K Sikdar; Intl. Journal of Engineering Intelligent Systems, Vol. 10, No. 1, March 2002, pp. 45-52.
  • Generalized Multiple Attractor Cellular Automata(GMACA) Model for Associative Memory: Niloy Ganguly, Pradipta Maji, Biplab K Sikdar and P Pal Chaudhuri; Intl. Journal of Pattern Recognition and Artificial Intelligence (IJPRAI); Vol. 16, No. 7, November, 2002; pp 781-795.
     
  • Design of Hierarchical Cellular Automata For On-Chip Test Pattern Generator: Biplab K Sikdar, Niloy Ganguly and P Pal Chaudhuri; IEEE Trans on CAD; Vol. 21, No. 12, December 2002; pp 1530-1539.
     
  • Fan-in-Factor and Fan-out-Factor (FiF-FoF) oriented BIST design for sequential machines: S Roy, U Maulik, S Bandyopadhyay, S Basu and Biplab K Sikdar; IEE Proceedings of Computer and Digital Techn- iques; Vol 150, issue 3, May 2003, pp 183-188.
     
  • Theory and Applications of Cellular Automata for Pattern Classification: Pradipta Maji, Chandrama Shaw, Niloy Ganguly, Biplab K Sikdar, B N Roy and P Pal Chaudhuri; Fundamenta Informaticae, 58(3-4), pp: 321-354, 2003.
  • Design and Characterization of Cellular Automata Based Associative Memory for Pattern Recognition: Niloy Ganguly, Pradipta Maji, Biplab K Sikdar and P Pal Chaudhuri; IEEE Transaction on System, Man and Cybernetics, Part B, Vol 34, No. 1, February 2004, pp 672-679.
  • Generation of Test Patterns Without Prohibi- ted Pattern Set: Biplab K Sikdar, Niloy Ganguly and P Pal Chaudhuri; IEEE Transaction on Computer Aided Design (TCAD), vol.23, issue 12, December 2004; pp 1650-1660.
  • A degree-of-freedom based synthesis scheme for sequential machines with enhanced BIST quality and reduced gate area: Biplab K Sikdar, S Roy and Debesh K Das; Journal of Electronic Testing: Theory and Applications (JETTA), vol 21, issue 1, January 2005; pp 83-93.
  • Fault Diagnosis of VLSI Circuits with Cellular Automata Based Pattern Classifier: Biplab K Sikdar, Niloy Ganguly and P Pal Chaudhuri; IEEE Transaction on Computer Aided Design (TCAD), vol. 24, no 7, July, 2005; pp 1115-1131.
  • Design of non-linear CA based TPG without Prohibited pattern set in linear time: Sukanta das, Anirban Kundu, Biplab K Sikdar and P Pal Chaudhuri; Journal of Electronic Testing: Theory and Applications(JETTA), vol 21, issue 1, January 2005; pp 95-107.
  • Fixed Spectral Coefficients for Detecting Multiple Stuck-at Faults in Combinational Circuits: Biplab K Sikdar, Debesh K Das and Bhargav B Bhattacharya; 4th Intl. Workshop on Applications of the Reed Muller Expansion in Circuit Design, 1999, Canada; pp 133-137. [12].Theory and Application of Cellular Automata for VLSI design and testing: P Pal Chaudhri, D R Chowdhuri, Kolin Paul and Biplab K Sikdar; 13th International Conference on VLSI Design, January 2000, India; pp 4-4. 
  • Theory and Application of GF(2p) Cellular Automata As On-Chip Test Pattern Generator: Biplab K Sikdar, Kolin Paul, Gosta Pada Biswas, Vamsi Boppana, Cliff Yang, Sobhan Mukherjee and P Pal Chaudhuri; 13th Intl. Conference on VLSI Design, Jan 2000, India; pp 556-561.
  • GF(2p) CA Based Vector Quantization for Fast Encoding of Still Images: Kolin Paul, Santoshil Pal Chaudhuri, Ranadeep Ghosal, Biplab Sikdar and D Roy Choudhury; 13th International Conference on VLSI Design, Jan 2000, India; pp140-143.
  • Hashing Through Cellular Automata: Niloy Ganguly, Debasish Halder, Janmejoy Deb, Biplab K Sikdar and P Pal Chaudhuri; 8th Intl. Conference on Advanced Computing and Communications, December 2000, India; pp 95-101.
  • GF(2p) Cellular Automata as a Built In Self Test Structure: Biplab K Sikdar, Debesh K Das, Vamsi Boppana, Cliff Yang, Sobhan Mukherjee and P Pal Chaudhuri; ASP-DAC, Jan-Feb 2001, Japan; pp 319-324.
  • Design of Multiple Attractor GF(2p)Cell- ular Automata for Diagnosis of VLSI Circuits: Biplab K Sikdar, Niloy Ganguly, Purnabha Majumder, and P Pal Chaudhuri; 14th International Conference on VLSI Design, January 2001, India; pp 454-459.
  • Hierarchical Cellular Automata as an On-Chip Test Pattern Generator: Biplab K Sikdar, Purnabha Majumder, M Mukherjee, Niloy Ganguly, Debesh K Das and P Pal Chaudhuri; 14th Intl. Conference on VLSI Design, January 2001, India; pp 403-408.
  • Multiple Attractor Cellular Automata for Hierarchical Diagnosis of VLSI Circuits: Biplab K Sikdar, Niloy Ganguly, Aniket Karmakar, Subha Sankar Chowdhury and P Pal Chaudhuri; Asian Test Symposium, November 2001, Japan; pp 385-390.
  • Enhancing BIST Quality of Sequential Machines Through Degree-of-freedom Analysis: Biplab K Sikdar, Samir Roy and Debesh K Das; Asian Test Symp, November 2001, Japan; pp 285-290.
  • Evolving Cellular Automata Based Associ- ative Memory for Pattern Recognition: Niloy Ganguly, Arijit Das, Pradipta Maji, Biplab K Sikdar and P Pal Chaudhuri; 8th Intl. Conference on High Performance Computing, December 2001, India; pp 115-124.
  • GF(2p) Cellular Automata as a Message Digest Generator: Monalisa Mukherjee, Biplab K Sikdar, Niloy Ganguly and P Pal Chaudhuri; 9th International Conference on Advanced Computing and Communications, Dec 2001, India; pp 205-212.
  • Cellular Automata Based Hamming Hash Family: Synthesis and Application: Niloy Ganguly, Biplab K Sikdar and P Pal Chaudhuri; 9th Intl. Conference on Advanced Computing and Communications, December 2001, India; pp 213-220.
  • Study of Non-linear Cellular Automata Model for Pattern Recognition: Pradipta Maji, Niloy Ganguly, Arijit Das, Biplab K Sikdar and P Pal Chaudhuri; Cellular Automata Conference, November 2001, Japan; pp 187-192.
  • Hierarchical Cellular Automata Model For VLSI Testing: Biplab K Sikdar, Niloy Ganguly, Debesh K Das and P Pal Chaudhuri; Cellular Automata Conference, November 2001, Japan; pp 90-95.
  • Cellular Automata Model for Cryptosystem: Niloy Ganguly, Arijit Das, Biplab K Sikdar and P Pal Chaudhuri; Cellular Automata Conference, Nov 2001, Japan; pp 120-125.
  • Design of On-Chip Test Pattern Generator Without Prohibited Pattern Set (PPS): Niloy Ganguly, Biplab K Sikdar and P Pal Chaudhuri; 15th International Conference on ASPDAC/VLSI Design, January 2002, India; pp 689-694.
  • Degree-of-Freedom Analysis for Sequential Machines Targeting BIST Quality and Gate Area: Samir Roy, Biplab K Sikdar, Monalisa Mukherjee and Debesh K Das; 15th Intl. Conference on ASPDAC/VLSI Design, 2002, January India; pp 671-676.
  • Characterization of Non-linear Cellular Automata Model for Pattern Recognition: Niloy Ganguly, Pradipta Maji, Arijit Das, Biplab K Sikdar and P Pal Chaudhuri; AFSS International Conference on Fuzzy Systems, 2002, India.
  • Evolving Cellular Automata as Pattern Classifier: Niloy Ganguly, Pradipta Maji, Sandip Dhar, Biplab K Sikdar and P Pal Chaudhuri; 5th Intl. Conference on Cellular Automata for Research and Industry, ACRI 2002, Switzerland; pp 241-.
  • Evolving Cellular Automata Model for PatternClassification and Recognition: Sourav Saha, Pradipta Maji, Niloy Ganguly, Biplab K Sikdar and P Pal Chaudhuri; IEEE International Conference on Systems, Man and Cybernetics, 2002, Tunisia; pp 114-119.
  • Design of a scalable logical topology for reliable optical communication: U Bhattacharya, R Chaki, N Chaki and B K Sikdar; IEEE Intl. Conference TENCON02, Oct 2002, Beijing, China; pp 1209-1212.
  • A congestion-controlled logical topology for multihop optical networks: U Bhattacharya, D Datta, B Chowdhury, G C Saha and B K Sikdar; IEEE International Conference TENCON02, Oct 2002, Beijing, China; pp 416-418.
  • An Evolutionary Design of Pseudo-Random Test Pattern Generator without Prohibited Pattern Set (PPS): Niloy Ganguly, Anindyasundar Nandi, Sukanta Das, Biplab K Sikdar and P Pal Chaudhuri; Asain Test Symposium, November 2002, Guam, USA; pp 260-265.
  • A reliable & scalable logical topology for multihop optical networks: U Bhattacharya, D Datta, B Chowdhury, G C Saha and B K Sikdar; Intl. Conference CIT, December 2002, Bhubaneswar, India.
  • Design of a Universal BIST (UBIST) Structure: Sukanta Das, Niloy Ganguly, Biplab K Sikdar and P Pal Chaudhuri; 16th International Conference on VLSI Design, 2003, Delhi, India; pp 161-166.
  • Exploring Ghost-FSMs as a BIST Structure for Sequential Machines: S Roy, U Maulik and Biplab K Sikdar; 16th Intl. Conference on VLSI Design, 2003, Delhi, India; pp 155-160.
  • Efficient BIST design for Sequential Machines using FiF-FoF values in machine states: S Roy, U Maulik, A Bandyopadhyay, S Basu and Biplab K Sikdar; ASP-DAC, 2003, Japan; pp 875-878.
  • Power Conscious BIST Design for Sequen- tial Circuits using Ghost-FSM: S Roy and Biplab K Sikdar; Asian Test Symposium, 2003, Xian, China; pp 190-195.
  • Non-Linear Cellular Automata based PRPG Design (Without Prohbited Pattern Set) in Linear time Complexity: Sukanta Das, Anirban Kundu, Subhayan Sen, Biplab K Sikdar and P Pal Chaudhuri; Asian Test Symp, 2003, Xian, China; pp 78-83.
  • An Efficient Design of Non-Linear CA based PRPG for VLSI Circuit Testing: Sukanta Das, Debdas Dey, Subhayan Sen, Biplab K Sikdar and Pal Chaudhuri; ASPDAC, 2004, Japan; pp 110-112.
  • Cellular Automata Evolution For Pattern Classification: P Maji, Biplab K Sikdar and P Pal Chaudhuri; Sixth Intl. Conference on Cellular Automata For Research and Industry, ACRI 2004, Netherlands, October 2004; pp 660-669.
  • Cellular Automata Evolution For Dist- ributed Data Mining: P Maji, Biplab K Sikdar and P Pal Chaudhuri; Sixth Intl. Conference on Cellular Automata For Research and Industry, ACRI 2004, October 2004; pp 40-49.
  • Cellular Automata based Encompression Tech- nology for Voice Data Encompression: C Shaw, P Maji, S Saha, B K Sikdar, S Roy, P. Pal Chaudhuri; Sixth Intl. Conference on Cellular Automata For Research and Industry, ACRI 2004, Netherlands, October 2004; pp 258-267.
  • Characterization of reachable/non- reachable Cellular automata states: Sukanta Das, B K Sikdar, P Pal Chaudhuri; Sixth Intl. Conference on Cellular Automata For Research and Industry, ACRI 2004, Netherlands, Oct 2004; pp 813-822.
  • Non-linear CA based scalable design of on-chip TPG for multiple cores: Sukanta Das, Biplab K Sikdar, P Pal Chaudhuri; Asian Test Symposium, Taiwan, November, 2004.
  • Non-linear CA based design of test set generator targeting pseudo-random pattern resistant faults: Sukanta Das, Anirban Kundu and Biplab K Sikdar; Asian Test Symposium, Taiwan, November, 2004.
  • CA based document compression technology: Chandrama Shaw, Biplab k Sikdar and N C Maiti; ICONIP, India, December, 2004; pp 679-685.
  • Cellular Automata Based Document Compression Technology For On-Line Network Transmission: Chandrama Shaw, Biplab K Sikdar and N C Maiti; ICECE2004, Bangladesh, December, 2004; pp 303-306.
  • Cellular Automata Based Test Structures with Logic Folding: Biplab K Sikdar, Sukanta Das, S Roy, Niloy Ganguly and Debesh K Das; 18th International Conference on VLSI Design, 2005, Kolkata, India; pp 71-74.
  • Non-linear Cellular Automata Based Design of Query Processor for Mobile Network: Sukanta Das, Sipra Das(Bit) and Biplab K Sikdar; IEEE SMC 2005 Conference, Hawaii, Oct 10-12, 2005; vol.3, pp 2751-56.
  • Synthesis of Testable Finite State Machine Through Decomposition: Biplab K Sikdar, Arijit sarkar, S Roy and Debesh K Das; IEEE 14th Asian Test Symposium, 2005, Kolkata, December 18-21, 2005; pp 398-403.
  • Cost Optimal Design of Nonlinear CA Based PRPG for Test Applications: Sukanta Das, Hafizur Rahaman and Biplab K Sikdar; IEEE 14th Asian Test Symposium, 2005, Kolkata, December 18-21, 2005; pp 284-287.


Courses Undertaken


Department of Computer Science & Technology, BESU, Shibpur - 7111 03, INDIA